PAC study of Ni-irradiated Sb films

Abstract

The Perturbed Angular Correlation method with In-111 tracers was applied to investigate the influence of implanted nickel impurities on the electric field gradient (EFG) in antimony films. A very strong dependence of EFG at low Ni concentrations was found. Ni implantations And thermal annealings did not destroy the texture produced during the deposition of the Sb films on Si (100) substrates. (C) 2002 Elsevier Science B.V. All rights reserved.