Texture and microstructure analysis with high-energy synchrotron radiation

Abstract

High-energy synchrotron radiation with wavelengths in the order of 0.1 Angstrom is used for texture and microstructure analysis of polycrystalline materials. By the conventional step-scan method, pole figures can be measured from which ODF with high angular resolution can be obtained. Additionally a continuous "sweeping" technique is used by which orientation as well as location maps are obtained. This technique is particularly suited to image continuous textures with sharp spatial gradients as well as grain-resolved textures. In this latter case the six-dimensional orientation stereology, comprising texture as well as microstructure, can be obtained. Because of its high penetration depths, comparable with that of neutrons, short-wave synchrotron radiation is particularly suited to study the interior of big samples.